NIST high accuracy reference reflectometer-spectrophotometer
نویسندگان
چکیده
منابع مشابه
NIST High Accuracy Reference Reflectometer-Spectrophotometer
A new reflectometer-spectrophotometer has been designed and constructed using state-of-the-art technology to enhance optical properties of materials measurements over the ultraviolet, visible, and near-infrared (UV-Vis-NIR) wavelength range (200 nm to 2500 nm). The instrument, Spectral Tri-function Automated Reference Reflectometer (STARR), is capable of measuring specular and diffuse reflectan...
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A bolometer detector system was developed for the high accuracy infrared spectrophotometer at the National Institute of Standards and Technology to provide maximum sensitivity, spatial uniformity, and linearity of response covering the entire infrared spectral range. The spatial response variation was measured to be within 0.1 %. The linearity of the detector output was measured over three deca...
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The evaluation procedure of a new laser-cooled caesium fountain primary frequency standard developed at the National Institute of Standards and Technology (NIST) is described. The new standard, NIST-F1, is described in some detail and typical operational parameters are discussed. Systematic frequency biases for which corrections are made – second-order Zeeman shift, black-body radiation shift, ...
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A phase-sensitive optical time domain reflectometer (Φ-OTDR) can be used for pipeline security. However, the sensing distance (less than 20 km) of traditional Φ-OTDR is too short for the needs of typical oil and gas pipeline monitoring applications (30-50 km). A simple structure Φ-OTDR system utilizing long pulse, balanced amplified detector and heterodyne detection is proposed in this paper an...
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A high precision reflectometer has been designed and implemented to measure directly the specular reflectance (R) of materials in the submillimeter (SM) region of the spectrum (300 GHz < ν < 3000 GHz). Previous laser-based measurement systems were limited to an uncertainty in R of approximately ± 1.0% due to a number of issues such as: lack of an absolute reflection standard, difficulties in th...
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ژورنال
عنوان ژورنال: Journal of Research of the National Institute of Standards and Technology
سال: 1996
ISSN: 1044-677X
DOI: 10.6028/jres.101.061